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PANalytical - Epsilon 3x Benchtop X-Ray Fluorescence (XRF) Spectrometers

For every analytical problem there is a tailored solution

Epsilon 3X instruments are benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers for elemental analysis in industry process control and research and development. It is a highly flexible analytical tool, suitable for a wide variety of industries and applications. Advanced spectrum processing and state-of-the-art quantification algorithms ensure accuracy and precision. Available in Epsilon 3X and Epsilon 3XLE versions, both instruments feature a high-performance ceramic tube, 50 kV excitation capabilities and the latest in silicon drift detector technology. Delivering accurate, precise and reliable analysis right across the periodic table, these instruments detect concentrations from 100% down to sub-ppm levels.

DKSH is the exclusive distributor in Cambodia, Laos, Malaysia, Myanmar, Philippines, Thailand and Vietnam.

Technical Specifications

Sample Handling- Sample Changer 10-position removable sample changer
Sample Handling- Sample Size Accommodates 25 to 52 mm diameter samples
Sample Handling- Spinner Included
X-Ray Tube- Window Type Metal-ceramic side window
X-Ray Tube- Window Size 50 µm thin window (Be)
X-Ray Tube- Max Voltage Software controlled, max. voltage 50 kV, max. 1 mA, max. 9W
Detector- Resolution High-resolution, typical 135 eV
Detector- Window Size 8 µm thin window (Be)
Detector- Resolution High-resolution silicon drift
Software Options- Modules Stratos, Omnian, FingerPrint, Enhanced Data Security, Oil-Trace
Available models
PANalytical Epsilon 3X Benchtop XRF Spectrometer Automation
Technical Specifications
Sample Handling- Sample Changer
10-position removable sample changer
Sample Handling- Sample Size
Accommodates 25 to 52 mm diameter samples
Sample Handling- Spinner
Included
X-Ray Tube- Window Type
Metal-ceramic side window
X-Ray Tube- Window Size
50 µm thin window (Be)
X-Ray Tube- Max Voltage
Software controlled, max. voltage 50 kV, max. 1 mA, max. 9W
Detector- Resolution
High-resolution, typical 135 eV
Detector- Window Size
8 µm thin window (Be)
Detector- Resolution
High-resolution silicon drift
Software Options- Modules
Stratos, Omnian, FingerPrint, Enhanced Data Security, Oil-Trace

Epsilon 3X is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The performance of the instrument is increased through 50 kV excitation capabilities, delivering excellent analytical performance.

PANalytical Epsilon 3X Benchtop XRF Spectrometer Automation
Technical Specifications
Sample Handling- Sample Changer
10-position removable sample changer
Sample Handling- Sample Size
Accommodates 25 to 52 mm diameter samples
Sample Handling- Spinner
Included
Mode
Large sample mode
X-Ray Tube- Window Type
Metal-ceramic side window
X-Ray Tube- Window Size
50 µm thin window (Be)
X-Ray Tube- Max Voltage
Software controlled, max. voltage 50 kV, max. 3 mA, max. 15 W
Detector- Resolution
Typical 135 eV
Detector- Type
SDDultra
Detector- Resolution
High-resolution silicon drift with ultra thin window
Software Options- Modules
Stratos, Omnian, FingerPrint, Enhanced Data Security, Oil-Trace

Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen. 

PANalytical Epsilon 3X Benchtop XRF Spectrometer Automation
Specifications
Sample variety
The automation option is suited for 51.5 mm PANalytical steel rings. Both pressed powder samples and fused beads can be measured. Other sample types are possible, on request.
Operator intervention
Ad-hoc samples can be measured by unlocking the cabinet door. The lid of Epsilon 3 will open after the previous measurement is finished. When the cabinet door is open, all moving components are locked to prevent from collisions with the operator. Samples are measured manually without leaving the automation mode.
Easy communication
Multiple communication possibilities are available for data delivery to LIMS systems via PANalytical’s Universal Automation Interface (UAI) software. Very limited physical connections are required and measurement data from Epsilon 3 software is transmitted automatically in ASCII code for further processing.
Fast analytical response
It only takes 30 seconds from the time the sample reaches the end of the conveyer belt to the time when the sample is located in the measuring position of the Epsilon 3. With a typical measuring time of 5 to 8 minutes, the total throughput time of the method is less than 10 minutes per sample.
Detector- Resolution
High-resolution silicon drift with ultra thin window
Software Options- Modules
Stratos, Omnian, FingerPrint, Enhanced Data Security, Oil-Trace

Historically, the automation of X-ray fluorescence (XRF) instruments has been limited to high-power wavelength dispersive (WD) XRF systems. However, more and more benchtop energy dispersive (ED) XRF spectrometers are sold into production control as cost-effective solutions because of improved performance. Recent advances in Epsilon 3X (ED)XRF spectrometers make them an attractive alternative in automated environments. The Epsilon 3X automation option is a simple and flexible solution interfacing your existing Epsilon 3 or new Epsilon 3X analyzer to any sample preparation equipment. The flexible sample introduction system is specifically designed to handle a variety of prepared samples coming from a belt, a robot or even from a manual input slide. 

  • High sensitivity through 50 kV excitation and smart detection technology

  • Simple, reliable operation

  • Omnian (semi-quantitative), FingerPrinting, Stratos (multi-layer analysis), Oil-Trace and and regulatory compliance module options

  • PANassist and worldwide service network support

  • Compliance readiness

  • Epsilon 3X instruments combine the latest excitation and detection technologies with state-of-the-art analysis software

  • Aerospace
  • Agriculture
  • Automotive
  • Biopharmaceutical and Biotechnology
  • Chemical
  • Construction
  • Cosmetics & Personal Care
  • Defense
  • Die & Mould
  • Education & Academics
  • Electronics
  • Energy
  • Environmental
  • Food & Beverage
  • Luxury
  • Machinery & Manufacturing
  • Medical
  • Mining & Minerals
  • Oil & Gas
  • Optical
  • Paper & Wood
  • Pharmaceutical
  • Polymers, Plastics and Rubbers
  • Powders & Pigments / Coating
  • Railway
  • Semiconductor, Solar & Electronics
  • Service
  • Textile
  • Wholesale & Retail

PANalytical's benchtop spectrometers

  • Cambodia
  • Laos
  • Malaysia
  • Myanmar
  • Philippines
  • Thailand
  • Vietnam
Malvern PanalyticalMalvern Panalytical was formed by the merger of the businesses Malvern Instruments and PANalytical on 1st January 2017, and employs over 2,000 people worldwide. Our technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better quality products and getting them to market faster. Our mission is to create superior, customer-focused solutions and services to deliver tangible economic impact through chemical, physical and structural analysis of materials.
[panalytical, Epsilon 3X, Epsilon, XRF, Spectrometers, x-ray fluorescence]