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DKSH (China) Ltd., 3rd Floor, Tomson Commercial Building
710 Dong Fang Road
Pudong, Shanghai 200122
+86 21 5830 0518 1002
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LayTec product portfolio covers all areas of process monitoring and control and offers all required solutions for process control from one source: in-situ, in-line, lab-line and map-line metrology. This enables complete integration and smooth communication of the metrology components with each other and with the process equipment. We make it easy to keep an eye and to control the quality at every step of the production process. Our modular technology platform offers metrology solution for your specific needs.
In-situ is a Latin phrase that translates literally to “in position”. Used in the context of process monitoring, it means that in-situ tools observe in real-time the formation of the thin film throughout the thin film deposition process. LayTec’s in-situ metrology enables the development of new thin-film processes, materials and structures. In established processes, it is a must for high yields and maximum uptimes. LayTec’s in-situ monitoring solutions are the most advanced on the market today. Our systems cover a complete range of thin-film applications, providing access to all significant thin film growth parameters.
In-line metrology means fast, automated, reliable and non-destructive measurements that are fully integrated into a production line for comprehensive process control. LayTec’s in-line metrology systems are applied in the photovoltaics, OLED/OPV, display, touch panel and glass coating industries. Typically, our in-line metrology applies multi-optical head configuration with extremely high data acquisition. These metrology systems are integrated into the transfer systems between the processing steps. Our gold standard is 100% monitoring coverage of the thin film devices with zero delay of the manufacturing process.
LayTec’s off-line equipment will save your time and money when used at-line in production or in your lab for quick and reliable estimation and quantification of certain product properties. Our lab-line tools are used for fast process optimization as well as for tests and product certification.
LayTec’s mapping tools provide characterization of thin film surfaces before and after processing. Our map-line solutions complement our product portfolio of in-situ, in-line and lab-line metrology tools and makes it possible to equip our customers and OEM partners with all required metrology from one source.
As a supplier of non-destructive metrology tools, LayTec closely cooperates with manufacturers of thin-film systems to develop the best possible solutions for their process monitoring and control. Our OEM components are created and tested according to the manufacturers’ specifications and standards. This guarantees:
LayTec is a major provider of integrated optical metrology systems for thin-film processes in the compound semiconductor and photovoltaics industry.
LayTec sensors are used in a broad range of thin-film applications such as compound semiconductor epitaxy, photovoltaic, oxide and organic deposition. Advanced use of measurement techniques such as reflectometry, emissivity corrected pyrometry, laser deflectometry, reflectance anisotropy spectroscopy are uniquely combined to create our series of novel products. LayTec’s in-situ metrology provides access to all key thin-film parameters in real-time – either during the deposition process or in-line.