The NIRS XDS RapidContent Analyzer enables rapid, nondestructive analyses of solid powders, coarser granulates, pellets or flakes. Composition or material identification testing is performed either in the laboratory or at-line, on samples contained in their original packaging, bags or vials. An optional variable spot-size feature enables the sample illumination to be adjusted based on the physical properties of your samples.
Sample interface | Direct analysis |
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Wavelength range | 400–2,500 nm |
Measuring module | Hot-swappable |
Detectors | Silicon 400–1,100 nm lead sulfide 1,100–2,500 nm |
Data collection speed | 2 scans/s |
Data point interval | 0.5 nm |
Wavelength accuracy (currently recognized standard) |
< 0.05 nm (SRM 1920) |
Wavelength precision 1 | < 0.005 nm |
Wavelength precision2 (instrument to instrument) | < 0.020 nm |
Stray light | < 0.1% at 2,300 nm |
Photometric linearity | < 1% of the measured value |
Bandpass | 8.75 ±0.10 nm |
Noise (RMS) | 400–700 nm < 50 micro AU 700–2,500 nm < 20 micro AU |
Weight | 38.0 kg (83.0 lbs) |
Dimensions (W × H × D) | 380 × 346 × 559 mm (15" × 13.6" × 22") |
Operating temperature range | 4.5–35°C (40–95°F) |
Relative humidity | 10–90% RH, non-condensing |