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Meet Aeris – our brand-new X-ray benchtop diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software.
Being a PANalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
Aeris can be connected with a belt or a robot for fast and automated sample processing.
The twin solution provides full material characterization by adding elemental composition information from Zetium to the phase identification by Aeris.
Rapid analysis minimizes feedback loops and allows early intervention for process optimization. Typical measurement times of Aeris are less than 10 minutes per sample.
Uptime of the analytical equipment is key for reliable process control. From the ground up, Aeris has been designed for maximum uptime.
The only benchtop XRD instrument with external sample loading for ultimate dust protection of the heart of the instrument.
No cooling water, no chiller, no compressed air - the only thing you need is a single-phase power socket.
Compatible with all common industry standards; from LIMS interfacing protocols to various industry-standard sample holders.
With the built-in touch screen your results are always just a few taps away: