The NIRS XDS MasterLab Analyzer enables the rapid, nondestructive analyses of solid-state dosage forms such as tablets, capsules, film-coated tablets, gel tablets and gel capsules for manufacturers in the pharmaceuticals industry. Solids in vials can also be analyzed with the NIRS XDS MasterLab Analyzer. The analysis takes place in reflection or transmission mode. The sample input proceeds via a sample slide that can be moved in x and y direction and that is designed for trays with several tablets and/or vials. Analyses of individual samples are optimized with an iris. An optionally available coarse granular sample cell for coarse granular substances extends analysis to include practically all solid forms ranging from fine powders to coarse granular materials, e.g., pellets and flakes
Measuring mode | Reflection and transmission |
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Sample interface | Direct analysis |
Reflection | 400–2,500 nm |
Transmission | 800–1,650 nm |
Measuring module | Hot-swappable |
Detectors | Reflection Silicon (400–1,100 nm), lead sulfide (1,100–2,500 nm) |
Transmission InGaAs (indium gallium arsenide) | 800–1,650 nm |
Data collection speed | 2 scans/s |
Data point interval | 0.5 nm |
Wavelength accuracy (currently recognized standard) | Reflection < 0.05 nm (SRM 1920) Transmission < 0.05 nm (Metrohm NIRS wavelength standards) |
Wavelength precision 1 | < 0.005 nm |
Wavelength precision 2 (instrument to instrument) | < 0.020 nm |
Stray light | < 0.1% at 2,300 nm |
Photometric linearity | < 1% of the measured value |
Bandpass | Reflection 8.75 ±0.10 nm Transmission 9.50 ±0.10 nm |
Noise (RMS): Reflection | 400–700 nm < 50 micro AU 700–2,500 nm < 20 micro AU |
Noise (RMS): Transmission | 850–1,100 nm < 30 micro AU 1,100–1,600 nm < 20 micro AU |
Weight | 39.0 kg (86.0 lbs) |
Dimensions (W × H × D) | 380 × 346 × 559 mm (15" × 13.6" × 22") |
Operating temperature range | 4.5–35°C (40–95°F) |
Relative humidity | 10–90% RH, non-condensing |