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The NIRS XDS RapidContent Analyzer enables rapid, nondestructive analyses of solid powders, coarser granulates, pellets or flakes. Composition or material identification testing is performed either in the laboratory or at-line, on samples contained in their original packaging, bags or vials. An optional variable spot-size feature enables the sample illumination to be adjusted based on the physical properties of your samples.
|Sample interface||Direct analysis|
|Wavelength range||400–2,500 nm|
|Detectors||Silicon 400–1,100 nm
lead sulfide 1,100–2,500 nm
|Data collection speed||2 scans/s|
|Data point interval||0.5 nm|
(currently recognized standard)
|< 0.05 nm (SRM 1920)|
|Wavelength precision 1||< 0.005 nm|
|Wavelength precision2 (instrument to instrument)||< 0.020 nm|
|Stray light||< 0.1% at 2,300 nm|
|Photometric linearity||< 1% of the measured value|
|Bandpass||8.75 ±0.10 nm|
|Noise (RMS)||400–700 nm < 50 micro AU
700–2,500 nm < 20 micro AU
|Weight||38.0 kg (83.0 lbs)|
|Dimensions (W × H × D)||380 × 346 × 559 mm
(15" × 13.6" × 22")
|Operating temperature range||4.5–35°C (40–95°F)|
|Relative humidity||10–90% RH, non-condensing|
To serve the Asia Pacific Region better, we were established in 1996 as a wholly-owned subsidiary of Metrohm AG, Switzerland. With a history that started in 1943, Metrohm AG is the world’s leading manufacturer of uncompromising quality precision instruments for chemical ion analysis and developer of tailor-made applications that help our customers safeguard their product quality, compliance with regulations, and process optimization.
Supporting the markets in Singapore and the Asia Pacific Region, are our dedicated teams of sales, service and support personnel who are all highly skilled and competent product specialists.