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The Surface Profile Analyzer can measure surface topography and roughness parameters with exceptional speed and resolution.

Utilizing the Imaging Topography software provides a comprehensive set of tools for the analysis of the studied surface. The Surface Profile Analyzer can be used to create 3D maps of large surface areas (up to 300 mm x 300 mm with automated sample table) and e.g. detect defects caused by material processing and treatment or the surface roughness can be analyzed according to various industry standards like ISO 25178, ISO 4287, ISO 13565, ISO 16610, etc.

Using the Surface Profile Analyzer in combination with an optical contact angle measuring and contour analysis system provides further insight into surface properties by e.g. determining the surface corrected contact angle according to the Wenzel theory.

With its high resolution, even the small particle deposits created by dosing individual picolitre-sized ink droplets can be analyzed.

White-light interferometry

The Surface Profile Analyzer utilizes white-light interferometry for studying the surface topography. White-light interferometry is an optical measuring technique and due to the relatively large distance between measuring instrument and test surface, there is no danger of damaging the sample compared to profiling systems that rely on some sort of stylus.

The increased amount of available parallel computation power provided by modern graphics cards enables highly sophisticated evaluation algorithms. Hence the Surface Profile Analyzer can process up to 500 GByte of image data with each scan and provide a height resolution of down to 0.1 nm using the extended phase-shift interferometry (EPSI) scan mode.

A significant advantage of white-light interferometry compared to other optical height resolving methods like focus variation or confocal microscopy is that the height (Z-direction) resolution is independent of the magnification factor of the used objective. The magnification factor only changes the lateral (X-Y-direction) resolution.

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