Particle size analysis in the range 0.01-3500 microns. For nanoparticle analysis see dedicated section.
Every year, hundreds of consumer electrical and electronic goods get recalled, dealing serious reputational and financial damages to brands and retailers. Electronics testing is done to not only determine the quality and safety of an electronic, as well to comply with international regulations.
Typical materials involved in advanced thin-film devices are semiconductors, metal alloys, dielectrics, oxides, and polymers. This mandates accurate monitoring and control of the device parameters using multiple investigation techniques. X-ray fluorescence (XRF) and X-ray diffraction (XRD) are an integral part of any such manufacturing process to monitor and control critical thin film parameters at every step equally important is the fine control over the process materials, like CMP slurry, which is an indispensable part of any thin-film device manufacturing. In most of these, the particle size and shape play an important role and need reliable characterization.
Contact us to discuss your analytical needs