Your Entry to the World of Automated XRF-Measurement
The FISCHERSCOPE® X-RAY XDL® and XDLM® X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!
The FISCHERSCOPE® X-RAY XDL® 230 is an X-ray fluorescence measuring instrument for simple, fast coating thickness measurement. Perfectly suited for the measurement of single or multiple coatings.
Save time and let the FISCHERSCOPE® X-RAY XDLM® 237 work for you! With the programmable XY-table, your Fischer X-RAY instrument performs measurements fully automatically.
Fischer is a leading specialist in material analysis, coating thickness measurement and material testing since 1953. We offer a wide range of measuring devices for different industries: from simple handheld devices for quick testing on the go to fully integrated, high-end systems that automatically monitor your production.
In the 1980s and 90s, Fischer greatly expanded its product range. In addition to a hardness tester, the first X-ray fluorescence (XRF) instrument was launched in 1981. Numerous patented innovations helped the devices to quickly establish themselves in industrial use – because customers appreciate the reliability and measuring precision of Fischer instruments.