We have developed the FISCHERSCOPE® X-RAY XDV®-µ especially for measuring smallest structures and components with short measuring times. A large-area silicon drift detector and the polycapillary optics enable precise, repeatable measurements e.g. on bond surfaces, SMD components or thin wires. That permits precise quality monitoring of the coatings on printed circuit boards – and ensures their long-term function.
The FISCHERSCOPE® X-RAY XDV®-µ LD is your XRF instrument for the measurement of bulky samples. Due to the measuring distance of 12 mm, even assembled PCBs can be measured without any problems.
The FISCHERSCOPE X-RAY XDV-µ is the XRF spectrometer of champions for champions! Benefit from measurements on small structures, short measuring times, automatic positioning via image recognition and low standard deviation. By using the FISCHERSCOPE® X-RAY XDV®-µ XRF, measurements on smallest structures can be performed.
The FISCHERSCOPE® X-RAY XDV-μ series is designed for precise coating thickness measurement and material analysis on very delicate structures. All devices are equipped with polycapillary optics that focus the X-ray beam, making measuring spots (fwhm) with diameters between 10 and 60 μm possible. The high intensity of the focused radiation results in a short measuring duration.
Fischer is a leading specialist in material analysis, coating thickness measurement and material testing since 1953. We offer a wide range of measuring devices for different industries: from simple handheld devices for quick testing on the go to fully integrated, high-end systems that automatically monitor your production.
In the 1980s and 90s, Fischer greatly expanded its product range. In addition to a hardness tester, the first X-ray fluorescence (XRF) instrument was launched in 1981. Numerous patented innovations helped the devices to quickly establish themselves in industrial use – because customers appreciate the reliability and measuring precision of Fischer instruments.